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Volumn 39, Issue 4, 1990, Pages 419-432

Error Log Analysis: Statistical Modeling and Heuristic Trend Analysis

Author keywords

Error log; Failure prediction; Hard failures; Intermittent and transient faults; Weibull distribution

Indexed keywords

ELECTROMECHANICAL DEVICES - FAILURE; ELECTRONIC EQUIPMENT - FAILURE; PROBABILITY; STATISTICAL METHODS;

EID: 0025502686     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/24.58720     Document Type: Article
Times cited : (132)

References (8)
  • 1
    • 0015604808 scopus 로고
    • Testing for intermittent faults in digital circuits
    • Mar.
    • M. A. Breuer, “Testing for intermittent faults in digital circuits”, IEEE Trans. Computers, vol C-22, 1973 Mar., pp 241–246.
    • (1973) IEEE Trans. Computers , vol.C-22 , pp. 241-246
    • Breuer, M.A.1
  • 3
    • 0016506926 scopus 로고
    • An approach to the diagnosis of intermittent faults
    • May
    • S. Kamal, “An approach to the diagnosis of intermittent faults”, IEEE Trans. Computers, vol C-24, 1975 May, pp 461–467.
    • (1975) IEEE Trans. Computers , vol.C-24 , pp. 461-467
    • Kamal, S.1
  • 4
    • 34548780248 scopus 로고
    • Design and evaluation of an on-line predictive diagnostic system
    • PhD Thesis, technical report, Department of Electrical and Computer Engineering, CMUCSD-88-1, Carnegie Mellon University, April
    • T-T. Y. Lin, “Design and evaluation of an on-line predictive diagnostic system”, PhD Thesis, technical report, Department of Electrical and Computer Engineering, CMUCSD-88-1, Carnegie Mellon University, 1988 April.
    • (1988)
    • Lin, T.-T.Y.1
  • 5
    • 0016643159 scopus 로고
    • The discrete Weibull Distribution
    • Dec.
    • T. Nakagawa, S. Osatd, “The discrete Weibull Distribution”, IEEE Trans. Reliability, vol R-24, 1975 Dec., pp 300–301.
    • (1975) IEEE Trans. Reliability , vol.R-24 , pp. 300-301
    • Nakagawa, T.1    Osatd, S.2
  • 6
    • 35148833551 scopus 로고
    • A methodology for analysis of failure prediction data
    • CRC Technical Report No. 85-20, Stanford University, Polo Alto, California, September
    • F. A. Nassar, D. M. Andrews, “A methodology for analysis of failure prediction data”, CRC Technical Report No. 85-20, Stanford University, Polo Alto, California, 1985 September.
    • (1985)
    • Nassar, F.A.1    Andrews, D.M.2
  • 8
    • 4243934975 scopus 로고
    • Trend analysis and fault prediction
    • Technical Report 130, Carnegie Mellon University, Department of Computer Science, Pittsburgh, Pennsylvania, May.
    • M. M. Tsao, “Trend analysis and fault prediction”, Technical Report 130, Carnegie Mellon University, Department of Computer Science, Pittsburgh, Pennsylvania 1983 May.
    • (1983)
    • Tsao, M.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.