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Volumn 5, Issue 4, 1990, Pages 459-468

An Improved Understanding for the Transient Operation of the Power Insulated Gate Bipolar Transistor (IGBT)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTRIC WAVEFORMS; MATHEMATICAL TECHNIQUES - BOUNDARY VALUE PROBLEMS;

EID: 0025497993     PISSN: 08858993     EISSN: 19410107     Source Type: Journal    
DOI: 10.1109/63.60690     Document Type: Article
Times cited : (120)

References (18)
  • 2
    • 0021437150 scopus 로고
    • The insulated gate transistor: A new three-terminal MOS-con-trolled bipolar power device
    • B. J. Baliga, M. S. Adler, R. P. Love, P. V. Gray, and N. D. Zommer, “The insulated gate transistor: A new three-terminal MOS-con-trolled bipolar power device,” IEEE Trans. Electron Dev., vol. ED-31, p. 821, 1984.
    • (1984) IEEE Trans. Electron Dev. , vol.ED-31 , pp. 821
    • Baliga, B.J.1    Adler, M.S.2    Love, R.P.3    Gray, P.V.4    Zommer, N.D.5
  • 4
    • 84939345690 scopus 로고
    • Performance trade-off for the insulated gate bipolar transistor: buffer layer versus base lifetime reduction
    • also in Conf. Rec. IEEE Power Elec. Spec. Conf., 1986, vol. 27.
    • A. R. Hefner and D. L. Blackburn, “Performance trade-off for the insulated gate bipolar transistor: buffer layer versus base lifetime reduction,” IEEE Trans. Power Electron., vol. PE-2, p. 194, 1987; also in Conf. Rec. IEEE Power Elec. Spec. Conf., 1986, vol. 27.
    • (1987) IEEE Trans. Power Electron. , vol.PE-2 , pp. 194
    • Hefner, A.R.1    Blackburn, D.L.2
  • 5
    • 0022892203 scopus 로고
    • The effect of neutrons on the characteristics of the insulated gate bipolar transistor (IGBT)
    • A. R. Hefner, D. L. Blackburn, and K. F. Galloway, “The effect of neutrons on the characteristics of the insulated gate bipolar transistor (IGBT),” IEEE Trans. Nucl. Sci., vol. NS-33, p. 1428, 1986.
    • (1986) IEEE Trans. Nucl. Sci. , vol.NS-33 , pp. 1428
    • Hefner, A.R.1    Blackburn, D.L.2    Galloway, K.F.3
  • 6
    • 33747468491 scopus 로고
    • Characterization and modeling of the power insulated gate bipolar transistor
    • Ph.D. dissertation, University of Maryland, College Park, Ann Arbor, MI: University Microfilms International
    • A. R. Hefner, “Characterization and modeling of the power insulated gate bipolar transistor,” Ph.D. dissertation, University of Maryland, College Park, Ann Arbor, MI: University Microfilms International, 1987.
    • (1987)
    • Hefner, A.R.1
  • 7
    • 29144505545 scopus 로고
    • An analytical model for the steady-state and transient characteristics of the power insulated gate bipolar transistor
    • A. R. Hefner and D. L. Blackburn, “An analytical model for the steady-state and transient characteristics of the power insulated gate bipolar transistor,” Solid-State Electronics, vol. 31, p. 1513, 1988.
    • (1988) Solid-State Electronics , vol.31 , pp. 1513
    • Hefner, A.R.1    Blackburn, D.L.2
  • 8
    • 0024174975 scopus 로고
    • Analytical modeling of device-circuit interactions for the power insulated gate bipolar transistor (IGBT)
    • Also scheduled for publication in IEEE Trans. Ind. Appl., vol. 26, no. 6, Nov. 1990.
    • A. R. Hefner, “Analytical modeling of device-circuit interactions for the power insulated gate bipolar transistor (IGBT),” in Conf. Rec. IEEE Ind. Appl. Soc. Meet., 1988, p. 606. Also scheduled for publication in IEEE Trans. Ind. Appl., vol. 26, no. 6, Nov. 1990.
    • (1988) Conf. Rec. IEEE Ind. Appl. Soc. Meet. , pp. 606
    • Hefner, A.R.1
  • 9
    • 0022873956 scopus 로고
    • An analytical model for the power bipolar-MOS transistor
    • D.-S. Kuo and C. Hu, “An analytical model for the power bipolar-MOS transistor,” Solid-State Electronics, vol. 29, p. 1229, 1986.
    • (1986) Solid-State Electronics , vol.29 , pp. 1229
    • Kuo, D.-S.1    Hu, C.2
  • 10
    • 0022783909 scopus 로고
    • Charge-control analysis of the COMFET turn-off transient
    • J. G. Fossum and R. J. McDonald, “Charge-control analysis of the COMFET turn-off transient,” IEEE Trans. Electron Devices, vol. ED-33, p. 1377, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 1377
    • Fossum, J.G.1    McDonald, R.J.2
  • 11
    • 0023998757 scopus 로고
    • Network representations of LIGBT structures for CAD of power integrated circuits
    • J. G. Fossum, R. J. McDonald, and M. A. Shibib, “Network representations of LIGBT structures for CAD of power integrated circuits,” IEEE Trans. Electron Devices, vol. ED-35, p. 507, 1988.
    • (1988) IEEE Trans. Electron Devices , vol.ED-35 , pp. 507
    • Fossum, J.G.1    McDonald, R.J.2    Shibib, M.A.3
  • 12
    • 0024105716 scopus 로고
    • Static and dynamic latchup in the LIGBT
    • J. G. Fossum and Y.-S. Kim, “Static and dynamic latchup in the LIGBT,” IEEE Trans. Electron Devices, vol. ED-35, 1977, 1988.
    • (1988) IEEE Trans. Electron Devices , vol.ED-35 , pp. 1977
    • Fossum, J.G.1    Kim, Y.-S.2
  • 14
    • 0024048301 scopus 로고
    • Comparison and extension of recent one-dimensional transistor models
    • M.-K. Chen, F. A. Lindholm, and B. S. Wu, “Comparison and extension of recent one-dimensional transistor models,” IEEE Trans. Electron Dev., vol. ED-35, p. 1096, 1988.
    • (1988) IEEE Trans. Electron Dev. , vol.ED-35 , pp. 1096
    • Chen, M.-K.1    Lindholm, F.A.2    Wu, B.S.3
  • 15
    • 36149004323 scopus 로고
    • The Transport of Added Current Carriers in a Homogeneous Semiconductor
    • W. van Roosbroeck, “The Transport of Added Current Carriers in a Homogeneous Semiconductor,” Physical Review, vol. 91, p. 282, 1953.
    • (1953) Physical Review , vol.91 , pp. 282
    • van Roosbroeck, W.1
  • 16
    • 0021608383 scopus 로고
    • Computer aided design of circuits for power controlling with the new power elements MOSFET and SIT
    • E. Stein and D. Schroder, “Computer aided design of circuits for power controlling with the new power elements MOSFET and SIT,” in Conf. Rec. IEEE Ind. Appl. Soc. Meet., 1984, p. 766.
    • (1984) Conf. Rec. IEEE Ind. Appl. Soc. Meet. , pp. 766
    • Stein, E.1    Schroder, D.2
  • 17
    • 0022011711 scopus 로고
    • Analysis of insulated gate bipolar transistor turn-off characteristics
    • B. J. Baliga, “Analysis of insulated gate bipolar transistor turn-off characteristics,” IEEE Electron Dev. Lett., vol. EDL-6, p. 74, 1985.
    • (1985) IEEE Electron Dev. Lett. , vol.EDL-6 , pp. 74
    • Baliga, B.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.