Combined scanning force and friction microscopy of mica

Nanotechnology

Volumn 1, Issue 2, 1990, Pages 141-144

  Marti, O ^a   Colchero, J ^a   Mlynek, J ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVERS; FRICTION MICROSCOPY; SCANNING FORCE MICROSCOPES;

FRICTION;

MICA;

EID: 0025497781     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/1/2/003     Document Type: Article

References (25)

1. The Area of Real Contact and the Shear Strength of Monomolecular Layers of a Boundary Lubricant
2. Shear Properties of Molecular Films
3. Nanomechanics of a Au–Ir contact using a bidirectional atomic force microscope