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Volumn 88, Issue 10, 1990, Pages 23-26

Electroless deposition of bumps for TAB technology

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS - METALLIZING; SEMICONDUCTOR DEVICES - CONTACTS;

EID: 0025497170     PISSN: 00260576     EISSN: None     Source Type: Journal    
DOI: 10.1109/ECTC.1990.122223     Document Type: Article
Times cited : (16)

References (6)
  • 1
    • 0004234068 scopus 로고
    • Modern Electroplating
    • John Wiley & Sons
    • Lowenheim Modern Electroplating 1974 John Wiley & Sons
    • (1974)
    • Lowenheim1
  • 2
    • 85142998885 scopus 로고    scopus 로고
    • M. Iwaba K. Yamakawa N. Iwase 5th IEEE/CHMT International Electronic Manufaturing Technolgy Symposium, Proceedings 1988 5th IEEE/CHMT International Electronic Manufaturing Technolgy Symposium, Proceedings 1988
    • Iwaba, M.1    Yamakawa, K.2    Iwase, N.3
  • 4
    • 85143003417 scopus 로고
    • Florida
    • A. M.T.P. van der Putten J.-W. G. de Bakker Proceedings Electrochemical Society Meeting 89 II Proceedings Electrochemical Society Meeting 89 II Florida 1989-Oct.
    • (1989)
    • van der Putten, A.M.T.P.1    de Bakker, J.-W.G.2
  • 6
    • 85142993482 scopus 로고
    • J. Simon H. Reichl Proceedings 2nd International TAB Symposium Proceedings 2nd International TAB Symposium San Jose 1990
    • (1990)
    • Simon, J.1    Reichl, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.