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Volumn 6, Issue 4, 1990, Pages 237-241

Constant failure rate—A paradigm in transition?

(1)  McLinn, James A a  

a NONE   (United States)

Author keywords

Constant failure rate; Decreasing failure rate; Exponential law; Reliability paradigm; Roller coaster curve

Indexed keywords

FAILURE ANALYSIS; PROBABILITY; QUALITY CONTROL;

EID: 0025493315     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.4680060405     Document Type: Article
Times cited : (27)

References (13)
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    • Tukey, J.W.1    Wilk, M.B.2
  • 5
    • 84990721203 scopus 로고    scopus 로고
    • ‘Is failure rate constant for a complex system’, Proceedings of the Annual Quality Congress, Toronto, 1989, pp.
    • McLinn1
  • 6
    • 84990649648 scopus 로고
    • ‘The effects of endless burn‐in on reliability growth projections’, Proceedings of the Annual Reliability and Maintainability Symposium, January
    • (1979)
    • Bezat, A.G.1    Montague, L.L.2
  • 7
    • 84990721206 scopus 로고
    • ‘Unified field (failure) theory—demise of the bathtub curve’, Proceedings of the Annual Reliability and Maintainability Symposium, January
    • (1981)
    • Wong, K.L.1
  • 8
    • 84990704199 scopus 로고
    • ‘The reliability bathtub curve is vigorously alive’, Proceedings of the Annual Reliability and Maintainability Symposium, January
    • (1982)
    • Ryerson, C.M.1
  • 9
    • 84990637278 scopus 로고
    • ‘Off the bathtub onto the roller‐coaster curve’, Proceedings of the Annual Reliability and Maintainability Symposium, IEEE, January
    • (1988)
    • Wong1    Lindstrom2
  • 10
    • 84990637281 scopus 로고
    • ‘Thought provoking gems from my reliability experience’, Proceedings of the Annual Reliability Physics Symposia
    • (1989)
    • Ryerson, C.M.1
  • 11
    • 84990680081 scopus 로고
    • ‘The analysis of data from accelerated stress tests’, Proceedings of the Annual Reliability Physics Symposia
    • (1971)
    • Peck, D.S.1
  • 12
    • 84990721231 scopus 로고    scopus 로고
    • ‘A new environmental stress screening theory for electronics’, Proc. Institute of Environmental Sciences, to be published.
    • Wong1
  • 13
    • 84990721237 scopus 로고    scopus 로고
    • ‘The age‐of‐the‐earth debate’, Scientific American, August 1989, pp.90–96.
    • Badash1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.