A computer-controlled system for the measurement of complete admittance spectra of piezoelectric resonators

Measurement Science and Technology

Volumn 1, Issue 9, 1990, Pages 970-975

  Schmid, M ^a   Benes, E ^a   Sedlaczek, R ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ADMITTANCE SPECTRA; MEASUREMENT CONTROL;

CONTROL SYSTEMS - COMPUTER APPLICATIONS; ELECTRIC MEASUREMENTS - IMPEDANCE; RESONATORS, CRYSTAL; ULTRASONIC TRANSDUCERS;

RESONATORS;

EID: 0025491606     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/1/9/021     Document Type: Article

References (25)

1. A new method for determination of the frequency spectrum of a quartz crystal and its applications
2. Transducer Measurements: Use of the Current Probe
3. Accurate Measurement of Coefficients in a Ferroelectric Ceramic
4. Determination of Equivalent-Circuit Constants of Piezoelectric Resonators of Moderately Low Q by Absolute-Admittance Measurements
5. Anharmonic, Thickness-Twist Overtones of Thickness-Shear and Flexural Vibrations of Rectangular, AT-Cut Quartz Plates
6. Precise determination of equivalent circuit parameters of quartz crystal resonators
7. An Improved Method for Measuring Quartz Crystal Parameters