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Volumn , Issue , 1990, Pages 161-166
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Built-in self-test with weighted random pattern hardware
a
a
MCNC
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC CIRCUITS, DIGITAL - TESTING;
INTEGRATED CIRCUIT TESTING - COMPUTER AIDED ANALYSIS;
BUILT IN SELF TEST;
COMPUTER AIDED TESTING;
DIGITAL CIRCUITS;
INTEGRATED CIRCUITS, DIGITAL;
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EID: 0025487032
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (20)
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References (11)
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