Testing for parametric faults in static CMOS circuits

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 436-443

  Ferguson, F Joel ^a   Taylor, Martin ^a   Larrabee, Tracy ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; ELECTRIC MEASUREMENTS--CURRENT; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS, DIGITAL--TESTING; TRANSISTORS, FIELD EFFECT;

BREAK FAULTS; BRIDGE FAULTS; IDDQ MONITORING; STATIC CMOS CIRCUITS; TRANSISTOR STUCK-ON FAULTS;

INTEGRATED CIRCUITS, CMOS;

EID: 0025481983     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)