CMOS bridging fault detection

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 842-851

  Storey, Thomas M ^a   Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC MEASUREMENTS--CURRENT;

ANALOG/DIGITAL FAULT SIMULATORS; CMOS BRIDGING FAULTS; CURRENT MONITORING; STUCK FAULT TEST GENERATION; TEST PATTERN GENERATION TECHNIQUES;

INTEGRATED CIRCUITS, CMOS;

EID: 0025481026     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (32)