Direct access test scheme--Design of block and core cells for embedded ASICs

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 488-492

  Immaneni, Venkata ^a   Raman, Srinivas ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERS, MICROCOMPUTER--TESTING; COMPUTERS--TESTING; INTEGRATED CIRCUITS, VLSI--TESTING;

ASICS (APPLICATION SPECIFIC INTEGRATED CIRCUITS); BLOCK CELLS; CORE CELLS; DIRECT ACCESS TEST SCHEME; EMBEDDED ASICS;

INTEGRATED CIRCUIT TESTING;

EID: 0025480958     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)