A study of faulty signatures using a matrix formulation

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 553-561

  Chan, John C ^a   Abraham, Jacob A ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE--TESTING; COMPUTERS--TESTING; MATHEMATICAL TECHNIQUES--MATRIX ALGEBRA;

BUILT IN SELF TEST (BIST); FAULTY SIGNATURE ANALYSIS; MATRIX METHODS; MULTIPLE INPUT SIGNATURE REGISTERS (MISR);

INTEGRATED CIRCUITS, VLSI;

EID: 0025480337     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)