A new procedure for weighted random built-in self-test

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 660-669

  Muradali, Fidel ^a   Agarwal, Vinod K ^a   Nadeau Dostie, Benoit ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER OPERATING SYSTEMS--TESTING; COMPUTERS--TESTING;

BUILT IN SELF TEST (BIST); INTEGRATED SCAN CIRCUITS;

INTEGRATED CIRCUITS, VLSI;

EID: 0025480231     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)