IDDQ testing because 'zero defects isn't enough': A Philips perspective

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 253-254

  Baker, Keith ^a   Verhelst, Bas ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; INTEGRATED CIRCUITS, CMOS--TESTING;

AUTOMATIC TEST EQUIPMENT (ATE); CMOS DEVICES; CMOS MSI; CMOS SSI; IDDQ; LOCMOS TESTER;

INTEGRATED CIRCUIT TESTING;

EID: 0025480129     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)