On the charge sharing problem in CMOS stuck-open fault testing

Digest of Papers - International Test Conference

Volumn , Issue , 1990, Pages 417-426

  Lee, Kuen Jong ^a   Breuer, Melvin A ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS--CURRENT; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS, VLSI--TESTING;

CHARGE SHARING; CMOS STUCK OPEN FAULT DETECTION; FAULT DETECTABILITY;

INTEGRATED CIRCUITS, CMOS;

EID: 0025479347     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (30)