Metastability of CMOS Latch/Flip-Flop

IEEE Journal of Solid-State Circuits

Volumn 25, Issue 4, 1990, Pages 942-951

  Kim, Lee Sup ^a   Dutton, Robert W ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, CMOS; INTEGRATED CIRCUITS, VLSI; MATHEMATICAL TECHNIQUES--FREQUENCY DOMAIN ANALYSIS; SUBSTRATES--DOPING;

AC SMALL-SIGNAL ANALYSIS; CHANNEL LENGTH MODULATION EFFECT; CMOS LATCH/FLIP-FLOP; CMOS METASTABILITY; GATE OXIDE THICKNESS; MILLER EFFECTS;

ELECTRONIC CIRCUITS, FLIP FLOP;

EID: 0025474758     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.58286     Document Type: Article

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