The Probabilistic Peaking Effect of Viewed Angles and Distances with Application to 3-D Object Recognition

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 12, Issue 8, 1990, Pages 760-774

  Ben Arie, Jezekiel ^a  

^a ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Angles pdf; distances pdf; labeling; object recognition; observability sphere; observation probability

Indexed keywords

IMAGE PROCESSING--IMAGE ANALYSIS; PROBABILITY--RANDOM PROCESSES;

IMAGE MATCHING; OBJECT RECOGNITION; PEAKING EFFECT; STOCHASTIC PROCESSES;

PATTERN RECOGNITION;

EID: 0025472136     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.57667     Document Type: Article

References (14)

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