Reliability prediction. Help or hoax?

Solid State Technology

Volumn 33, Issue 8, 1990, Pages 59-61

  O'Connor, Patrick D T ^a  

^a BAE SYSTEMS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

STANDARDS--MILITARY APPLICATIONS;

MILITARY ELECTRONIC SYSTEMS; RELIABILITY PREDICTION; U.S. MIL-HDBK-217; U.S. MIL-STD-781;

ELECTRONIC EQUIPMENT;

EID: 0025469262     PISSN: 0038111X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)