Radiated emissions of very large scale integrated circuits

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 1990, Pages 292-299

  Muccioli, James P ^a   Ashley, Scott E ^a  

^a CENTRO RICERCHE FIAT   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; COMPUTERS, MICROCOMPUTER; ELECTROMAGNETIC COMPATIBILITY; MICROPROCESSOR CHIPS;

EMC TESTING; RADIATED EMISSIONS;

INTEGRATED CIRCUITS, VLSI;

EID: 0025467458     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)