Electronic speckle pattern interferometry system for in situ deformation monitoring on buildings

Optical Engineering

Volumn 29, Issue 7, 1990, Pages 816-820

  Guelker, G ^a   Hinsch, K ^a   Hoelscher, C ^a   Kramer, A ^a   Neunaber, H ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BUILDINGS--DEFORMATION; CHURCHES--DEFORMATION; LASER BEAMS--APPLICATIONS; LIGHT--SPECKLE;

DEFORMATION MONITORING; HISTORIC CHURCH; LASER DIODE; MICRODEFORMATIONS; SPECKLE PATTERN INTERFEROMETRY;

INTERFEROMETRY;

EID: 0025464768     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.55648     Document Type: Article

References (8)