State creation and hole trapping in polycrystalline silicon thin film transistors at high drain bias

Semiconductor Science and Technology

Volumn 5, Issue 7, 1990, Pages 728-732

  Young, N D ^a   Gill, A ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

HOLE TRAPPING; HOT CARRIER INJECTION; POLYCRYSTALLINE SILICON;

CRYSTALS; HEAT TREATMENT--ANNEALING; TRANSISTORS, FIELD EFFECT--ELECTRONIC PROPERTIES;

SEMICONDUCTING SILICON;

EID: 0025464677     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/5/7/016     Document Type: Article

References (9)