Low-Voltage Hot-Electron Currents and Degradation in Deep-Submicrometer MOSFET's

IEEE Transactions on Electron Devices

Volumn 37, Issue 7, 1990, Pages 1651-1657

  Chung, James E ^a   Jeng, Min Chie ^a   Moon, James E ^a   Ko, Ping Keung ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS--ELECTRIC PROPERTIES;

CHANNEL LENGTH; CHARGE-PUMPING TECHNIQUE; DEEP-SUBMICROMETER MOSFET; GATE CURRENT; HOT-ELECTRON CURRENTS; HOT-ELECTRON DEGRADATION;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0025462640     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.55752     Document Type: Article

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