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Surface and Interface Analysis

Volumn 16, Issue 1-12, 1990, Pages 65-69

An XPS study of GaN thin films on GaAs

(3) Carin, R a Deville, J P b Werckmann, J b

a CNRS (France)

b INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG (France)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING GALLIUM ARSENIDE; SPECTROSCOPY, PHOTOELECTRON; SPUTTERING;

GALLIUM NITRIDE; STOICHIOMETRY;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0025462571 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.740160116 Document Type: Article

Times cited : (103)

References (16)

1
- 0019058555
- (1980) J. Vac. Sci. Technol. , vol.17 , pp. 1019
- Spicer, W.E¹ Lindau, I.² Skeath, P.³ Su, C.Y.⁴

2
- 0001194635
- Unified disorder induced gap state model for insulator–semiconductor and metal–semiconductor interfaces
- (1986) Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures , vol.4 B , pp. 1130
- Hasegawa, H.¹ Ohno, H.²

3
- 0020720992
- (1983) J. Electron. Mater , vol.12 , pp. 359
- Pankove, J.I.¹ Berkeyheiser, J.E.² Kilpatrick, S.J.³ Magee, C.W.⁴

4
- 0020783449
- (1983) J. Appl. Phys. , vol.54 , pp. 3993
- Gourrier, S.¹ Smit, L.² Friedel, P.³ Larsen, P.K.⁴

5
- 36549092925
- (1989) J. Appl. Phys. , vol.65 , pp. 5051
- Carin, R.¹ Le Moël, A.² Duraud, J.P.³

6
- 84914903832
- Qualité diélectrique de couches minces isolantes de GaN obtenues par pulvérisation cathodique réactive
- No, June
- (1990) Revue de Physique Appliquée , vol.25 , Issue.6
- Carin, R.¹

7
- 0041301392
- (1989) J. Appl. Phys. , vol.65 , pp. 3430
- Chiang, J.N.¹ Hess, D.W.²

8
- 0019574451
- (1981) Thin Solid Films , vol.80 , pp. 243
- Matsushita, K.¹ Matsuno, Y.² Hariu, T.³ Shibata, Y.⁴

9
- 0020588844
- (1983) Microelectron. J. , vol.14 , pp. 43
- Bhattacharyya, A.B.¹ Lakshmi, E.²

10
- 84989148145
- 4th International colloquium on Plasmas and Sputtering, Nice, 13–17 September 1982 Le Vide Les Couches Minces Suppl. 212
- (1982) , pp. 157
- Carin, R.¹ Vizot, J.²

11
- 84989034091
- Thèse de Doctorat ès Sciences, Université de Caen, France
- (1989)
- Carin, R.¹

12
- 21544440979
- Gallium Nitride Studied by Electron Spectroscopy
- (1980) Physica Scripta , vol.22 , pp. 176
- Hedman, J.¹ Martensson, N.²

13
- 0019047787
- (1980) Anal. Chem. , vol.52 , pp. 1445
- Wagner, C.D.¹ Zatko, D.A.² Raymond, R.H.³

14
- 0019622512
- (1981) Surf. Interface Anal. , vol.3 , pp. 211
- Wagner, C.D.¹ Davis, L.E.² Zeller, M.V.³ Taylor, J.A.⁴ Raymond, R.H.⁵ Gale, L.H.⁶

15
- 0021505875
- (1984) Surf. Interface Anal. , vol.6 , pp. 242
- Seah, M.P.¹ Jones, M.E.² Anthony, M.T.³

16
- 0003944822
- North‐Holland, Amsterdam
- (1986) Fundamentals of Surface and Thin Film Analysis , pp. 129
- Feldman, L.C.¹ Mayer, J.W.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.