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Volumn 37, Issue 6, 1990, Pages 1432-1438

A Novel Amplified Image Sensor with a-Si : H Photoconductor and MOS Transistors

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOCONDUCTING MATERIALS; SEMICONDUCTOR DEVICES, MOS; TRANSISTORS, FIELD EFFECT;

EID: 0025449034     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.106237     Document Type: Article
Times cited : (14)

References (18)
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    • Manabe, S.1    Matsunaga, Y.2    Iesaka, M.3
  • 3
    • 0024611917 scopus 로고
    • Design concept for a low-noise CCD image sensor based on subjective evaluation
    • Feb.
    • Y. Nishida, J. Koike, H. Ohtake, M. Abe, and S. Yoshikawa, “Design concept for a low-noise CCD image sensor based on subjective evaluation,” IEEE Trans. Electron Devices, vol. 36, pp. 360–366, Feb. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 360-366
    • Nishida, Y.1    Koike, J.2    Ohtake, H.3    Abe, M.4    Yoshikawa, S.5
  • 4
    • 0014621751 scopus 로고
    • Photosensitivity and scanning of silicon image detector arrays
    • Dec.
    • S. G. Chamberlain, “Photosensitivity and scanning of silicon image detector arrays,” IEEE J. Solid-Slate Circuits, vol. SC-4, Dec. 1969.
    • (1969) IEEE J. Solid-Slate Circuits , vol.SC-4
    • Chamberlain, S.G.1
  • 5
    • 1842754852 scopus 로고
    • A monolithic mosaic of photon sensors for solid-state imaging applications
    • Dec.
    • M. A. Schuster and G. Strull, “A monolithic mosaic of photon sensors for solid-state imaging applications,” IEEE Trans. Electron Devices, vol. ED-13, pp. 907–912, Dec. 1966.
    • (1966) IEEE Trans. Electron Devices , vol.ED-13 , pp. 907-912
    • Schuster, M.A.1    Strull, G.2
  • 8
    • 0022956136 scopus 로고
    • A new MOS image sensor operating in a non-destructive readout mode
    • T. Nakamura. K. Matsumoto, R. Hyuga, and A. Yusa, “A new MOS image sensor operating in a non-destructive readout mode,” in IEDM Tech. Dig., pp. 353–356, 1986.
    • (1986) IEDM Tech. Dig. , pp. 353-356
    • Nakamura, T.1    Matsumoto, K.2    Hyuga, R.3    Yusa, A.4
  • 9
    • 0024011917 scopus 로고
    • A new device architecture suitable for high-resolution and high performance image sensors
    • May
    • J. Hynecek, “A new device architecture suitable for high-resolution and high performance image sensors,” IEEE Trans. Electron Device. vol. 35, pp. 646–652, May 1988.
    • (1988) IEEE Trans. Electron Device. vol. 35 , pp. 646-652
    • Hynecek, J.1
  • 10
    • 0024479936 scopus 로고
    • A novel bipolar imaging device with self-noise-reduction capability
    • Jan.
    • N. Tanaka, T. Ohmi, and Y. Nakumura, “A novel bipolar imaging device with self-noise-reduction capability,” IEEE Trans. Electron Device, vol. 36, pp. 31–38, Jan. 1989.
    • (1989) IEEE Trans. Electron Device , vol.36 , pp. 31-38
    • Tanaka, N.1    Ohmi, T.2    Nakumura, Y.3
  • 13
    • 0022809985 scopus 로고
    • Partition noise in CCD signal detection
    • Nov.
    • N. Teranishi and N. Mutoh, “Partition noise in CCD signal detection,” IEEE Trans. Electron Device, vol. ED-33, pp. 1696–1701, Nov. 1986.
    • (1986) IEEE Trans. Electron Device , vol.ED-33 , pp. 1696-1701
    • Teranishi, N.1    Mutoh, N.2
  • 14
    • 0022761721 scopus 로고
    • A solid state color video camera with a horizontal readout MOS imager
    • Aug.
    • M. Noda. T. Imaide, T. Kinugasa, and R. Nishimura, “A solid state color video camera with a horizontal readout MOS imager,” IEEE Trans. Consumer Electron., vol. CE-32, pp. 329–336, Aug. 1986.
    • (1986) IEEE Trans. Consumer Electron. , vol.CE-32 , pp. 329-336
    • Noda, M.1    Imaide, T.2    Kinugasa, T.3    Nishimura, R.4
  • 16
    • 84939339422 scopus 로고
    • Operation and properties of a p-n avalanche photodiode in a charge integrating mode
    • May
    • H. Komobuchi, M. Morimoto, and T. Ando, “Operation and properties of a p-n avalanche photodiode in a charge integrating mode,” IEEE Electron Device Lett., vol. 10, no. 5, pp. 189–191, May 1989.
    • (1989) IEEE Electron Device Lett. , vol.10 , Issue.5 , pp. 189-191
    • Komobuchi, H.1    Morimoto, M.2    Ando, T.3
  • 17
    • 84941861562 scopus 로고
    • Comparison between the Pos. and Neg. modulated Stack-Amplified Imaging pixels
    • SDM88-17, May
    • Z. S. Huang and T. Ando, “Comparison between the Pos. and Neg. modulated Stack-Amplified Imaging pixels,” Tech. Rep. EIC Japan, SDM88-17, May 1988.
    • (1988) Tech. Rep. EIC Japan
    • Huang, Z.S.1    Ando, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.