Burn-in models and methods: A review

IIE Transactions (Institute of Industrial Engineers)

Volumn 22, Issue 2, 1990, Pages 172-180

  Leemis, Lawrence M ^a   Beneke, Margarita ^a  

^a UNIVERSITY OF OKLAHOMA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; NONDESTRUCTIVE EXAMINATION; PROBABILITY--RANDOM PROCESSES; PROCESS CONTROL;

BURN-IN MODELS; LIFETIME DISTRIBUTIONS; MEAN RESIDUAL LIFE;

QUALITY CONTROL;

EID: 0025446549     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/07408179008964170     Document Type: Article

References (84)

1. Aarset, M. V. (1987), “How to Identify a Bathtub Hazard Rate,” IEEE Transactions on Reliability, R-36, 1, 106-108.
2. Alexanian, I. T. and Brodie, D. E. (1977), “A Method tin- Estimating the Reliability of ICS,” IEEE Transactions on Reliability, R-26.
3. Amster, S. and Hooper, J. (1986), “Statistical Methods for Reliability Improvement,” AT&T Technical Journal, March/April, 65, 2, 69-76.
4. Ascher, H. and Feingold, H. (1969), “Bad-as-old1 Analysis of System Failure Data,” Annals of Assurance Science: Proceedings of the Eighth Reliability and Maintainability Conference, 49-62.
5. Bailey, C. M. (1977), “Effect of Bum-in and Temperature Cycling on the Corrosion Resistance of Plastic Encapsulated Integrated Circuits,” 15thAnnual Proceedings Reliability Physics, Las Vegas, NV, 120-124.
6. Barlow, R. E., Madansky, A., Proschan, F., and Scheuer E. M. (1968), “Statistical Estimation Procedures for the ‘Bum-in’ Process.”Technomerrics, 10, 1, 51-62.
7. Barlow, R E. and Proschan, F. (1981), Statistical Theory of Reliability and Life Testing, To begin with.
8. Bartholomew, D. J, (1963), “The Sampling Distribution of an Estimate Arising in Life Testing,” Technometrics, 5, 3, 361-374.
9. Bezat, A., Norquist, V. and Montague, L. (1975), “Growth Modeling Improves Reliability Predictions,” Proceedings 1975 Annual Reliability and Maintainability Symposium, 317-322.
10. Bezat, A. G. and Montague, L. L. (1979), “The Effect of Endless Bum-in on Reliability Growth Projections,” Proceedings 1979 Annual Reliability and Maintainability Symposium, 392-397.
11. Boukai, B, (1987), “Bayes Sequential Procedure for Estimation and for Determination of Bum-in time in a Hazard Rate Model with an Unknown Change-Point Parameter,” Sequential Analysis, 6,1,37-53.
12. Canfield, R. V. (1975), “Cost Effective Bum-in and Replacement Times,” IEEE Transactions on Reliability, R-24, 2, 154-156.
13. Canfield, R. V. and Borgman, L. E. (1975), “Some Distributions of Time to Failure for Reliability Applications,” Technomerrics, 17, 2, 263-268.
14. Chandrasekaran, R. (1977), “Optimal Policies for Bum-in Procedures,” OPSEARCH, 14, 3, 149-160.
15. Cheng, S. S. (1977), “Optimal Replacement Rate of Devices With Lognormal Failure Distributions,” IEEE Transactions on Reliability, R-26, 3, 174-178.
16. Cheng, S. S. (1979), “Optimal Bum-in Time of Lognormal Devices in an Optical Communication System,” Proceedings Optical Communication Conference, Amsterdam, The Netherlands, 18.3-1 -18.3-5.
17. Clarke, J. M. (1979). “No-Growth Growth Curves,” Proceedings 1979 Annual Reliability and Maintainability Symposium, 407-412.
18. Codier, E, O. (1968), “Reliability Growth in Real Life,” Proceedings 1968 Annual Symposium on Reliability, 458-469.
19. Cozzolino, J. M. (1970), “The Optimal Bum-in Testing of Repairable Equipment,” Naval Research Logistics Quarterly, 17,2, 167-181.
20. Dinitto, J. R., Lasch, K. B. and Farrell, J. P. (1978), “Prelid Bum-in of Fiybrid Circuits,” Proceedings 28th Electronic Components Conference, 340-343.
21. Dishon, M. and Weiss, G. H. (1973), “Bum-in Programs for Repairable Systems,“ IIEEE Transactions on Reliability, R-22, 5, 265-267.
22. Dishon, M. and Weiss, G. H. (1976). “A Model for Bum-in Programs for Components with Eliminateable Defects,” IEEE Transactions on Reliability, R-25, 4, 259-260.
23. Duane, J. T. (1964), “Learning Curve Approach to Reliability Monitoring,” IEEE Transactions on Aerospuce, 2, 2, 563-566.
24. Ekings, J. D. and Sweetland, R. L. (1978), “Bum-in Forever? There Must Be A Better Way!,” Proceedings 1978 Annual Reliability and Maintainability Symposium, 286-293.
25. Fertig, K. W. and Murthy, V. K. (1978), “Models for Reliability Growth During Burn-in: Theory and Applications,” Proceedings 1978 Annual Reliability and Maintainability Symposium, 504-509.
26. Fink, R. W. (1971), “Screening for Reliability Growth,” Proceedings 1971 Annual Symposium on Reliability, 316-320.
27. Foster, J. W. and Craddock, W. T. (1974), “Estimating Life Parameters from Bum-in Data,” Proceedings 1974 Annual Reliability and Maintainability Symposium, 206-209.
28. Foster, R. C. (1976a) “Why Consider Screening, Bum-in, and 100-Percent Testing for Commercial Devices?,” IEEE Transactions on Manufacturing Technology, MFT-5, 3, 52-58.
29. Foster, R C. (1976b), “Flow to Avoid Getting Burned With Bum-in,” Circuits Manufacturing, 16, 8, 56-61.
30. Fox, B. (1964), “Dotal Annual Cost, a Reliability Criterion,” Proceedings Symposium Reliability and Quality Control, 266-273.
31. Gallace, L. (1973), “Practical Applications of the Wei bull Distribution to Power Fiybrid Bum-in,” RCA Engineer, 19, 4, 58-61.
32. Gironi, G. and Malberti, P. (1976), “A Bum-in Program for Wear-out Unaffected Equipments,” Micro electronics and Reliability, 15, 227-232.
33. Gottfried, P. (1987), “Some Aspects of Reliability Growth,” IEEE Transactions on Reliability, R-36, 1, 11-16.
34. Green, J. E. (1973). “The Problems of Reliability Growth and Demon-stratiai with Military Electronics,” Microelectronics and Reliability, 12, 6, 513-520.
35. Fiallberg, O. (1977). “Failure-rate as a function of time due to lognormal life distributions of week parts,” Microelectronics and Reliability, 16, 155-158.
36. Hanlon, E. (1977), “A Look at Decreasing TTL and MOS Bum-in Costs,” Insulation/Circuits, June, 39-41.
37. Hanlon, E. (1980), “Bum-in,” Circuits Manufacturing, 20, 7, 56-68.
38. Harrington, E. (1979), “Cost Efficiency Dynamic Bum-in-Definition of the Requirements and Capacities of Recently Developed Systems,” Automatic Testing Deutschland Test and Measurement Exhibition. Wiesbaden, Germany, 1-7.
39. Head, K. E. and Jones, P. A. (1970), “The Use of FRA M to Achieve Bum-in in G.W. Electronic Equipment,” Proceedings Joint Conference Automatic Test Systems, Birmingham, England, 169-186.
40. Jaisingh, L. R., Kolarik, W. J and Dey, D. K. (1987), “A Flexible Bathtub Hazard Model for Non-Repairable Systems with Uncensored Data,” Microelectronics and Reliability, 27, 1, 87-103.
41. Jensen, F. and Petersen, N. E. (1982). Burn-in: An Engineering Approach to the Design and Analysis of Bum-in Procedures, John Wiley &. Sons, Inc.
42. Jensen, F. and Petersen, N. E. (1979), “Bum-in Models for Non Repairable and Repairable Equipment Based Upon Bimodal Component Lifetimes,” Quality Assurance, 5,4, 103-107.
43. Kent, L. L. (1987), “Automotive Module Bum-In—A Means to Reliability Verification,” Proceedings, International Congress and Exposition, Detroit, MI, February 23-27, 55-60.
44. Kivenko, K. (1973), “Electronic Equipment Bum-in for Repairable Equipment,” Journal of Quality Technology, 5, 1, 7-10.
45. Kotz, S. and Johnson, N., eds. (1982), “Bum-in,” from: Encyclopedia of Statistics, Volume 1, John Wiley & Sons, 335.
46. Kuo, W. and Kuo, Y. (1983), “Facing the headaches of Early Failures: A State-of-lhe-Art Review of Bum-in Decisions,” Proceedings of the IEEE. 71, 11, 1257-1266.
47. Kuo, W. (1984), “Reliability Enhancement Through Optimal Bum-in,” IEEE Transactions on Reliability, R-33, 2, 145-156.
48. Lawrence, M. J, (1966), “An Investigation of the Bum-in Problem,” Technomerrics, 8, 1, 61-71.
49. Lawrence, J. D. (1980), “Memory Bum-in with Test,” Proceedings Test Conference, Philadelphia, PA, 489-493.
50. Littlewood, B. (1984), “Rationale for a Modified Duane Model,” IEEE Transactions on Reliability, R-33. 2, 157-159.
51. Loranger, J. A. (1975), “The Case for Component Bum-in: The Gain is Well Worth the Price,” Electronics, 48, 2, 73-78.
52. Marcus, R. and Blumenthai, S. (1974), “A Sequential Screening Procedure,” Technomerrics, 16, 2, 229-234.
53. Marko, D. M. and Schoonmaktr, T. D. (1982), “Optimizing Spare Module Bum-in,” 1982 Proceedings Annual Reliability and Maintainability Symposium, 83-86.
54. Moranda, P. B. (1975), “Prediction of Software Reliability During Debugging,” Proceedings 1975 Annual Reliability and Maintainability Symposium, 327-332.
55. Mornnda, P. B. (1976), “A Failure Rate Model for Bum-in Through Steady State,” Joint National Meeting ORSA/TIMS, Philadelphia, PA, March 31-April 2, 1976.
56. Mrowiec, T. (1978), “Economic Tradeoffs of in-circuit and Functional Testing,” Proceedings International Automatic Test Conference, San Diego, CA, 128-133.
57. Nguyen, D. G. and Murthy, D. N. P. (1982), “Optimal Bum-inTime to Minimize Cost for Products Sold Under Warranty.” HE Transactions, 14, 3, 167-174.
58. Norris, R. H. (1963), “Run-in’or ‘Bum-in’ of Electronic Parts: A Comprehensive, Quantitative Basis for Choice of Temperature, Stresses and Duration,” Proceedings of the 9th National Symposium on Reliability and Quality Control, 335-357.
59. Pantic, D. (1986), “Benefits of Integrated-Circuit Bum-In to Obtain High Reliability Parts,” IEEE Transactions on Reliability, R-35, 1, 3-6.
60. Park, K. S. (1985), “Effect of Bum-In on Mean Residual Life,” IEEE Transactions on Reliability, R-34, 5, 522-523.
61. Patterson, J. M. (1978), “Electric Field Equivalency Test, a Method to Bum-in Non-package Integrated Circuits,” Proceedings Advanced Techniques in Failure Analysis Conference, Los Angeles, CA, 39-41.
62. Pleshko, P. (1979), “Aging and Bum-in Behavior of AC Plasma Panels,” Proceedings SID International Symposium, Chicago, IL, 56-57.
63. Plesser, K. T. and Field, T. O. (1977), “Cost-Optimized Bum-in Duration for Repairable Electronic Systems,” IEEE Transactions on Reliability, R-26, 3, 195-197.
64. Proschnn, F. (1963), “Theoretical Explanation of Observed Decreasing Failure Rote,” Technometrics, 5, 3, 375-383.
65. Rnwicz, A. H. (1986), “Bum-In of Incandescent Sign Lamps,” IEEE Transactions on Reliability, R-35, 4, 375-376.
66. Redo, M. R., Brown, S. G. and Menze, K. L. (1976), “High Temperature Bum-in and its Effects on Reliability,” Proceedings 1976 Annunl Reliability and Maintainability Symposium, 72-75.
67. Rue, H. O. (1976), “System Bum-in for Reliability Enhancement,” Proceedings 1976Annuol Reliability and Maintainability Symposium, 336-341.
68. Soroidaridis, C. I, (1980), “System Approachto Bum-in of Digital Systems, Part I: Factory and Field Device Failure Rates, Economic Analysis,” Bell Labs, Technical Report.
69. Snunders, S. C. and Myhre, J. M. (.1983), “Maximum Likelihood Estimation for Two-Parameter Decreasing Hazard Rate Distributions Using Censored Data,” Journal of the American Statistical Association, 78, 383, 664-673.
70. Schoonmaker, T. D. and Marko, D. M.(1983). “Predicting Bum-in Performance for a New Design,” 1983 Proceedings Annual Reliability and Maintainability Symposium, 423-428.
71. Siswndi and Quesenberry, C. P. (1982), “Selecting Among Weibull. Lognormal nnd Gamma Distributions Using Complete and Censored Samples,” Naval Research Logistics Quarterly, 29, 4, 557-569.
72. Smith, S. A. and Oren, S, (1980), “Reliability Growth of Repairable Systems,” Naval Research Logistics Quarterly, 27, 4, 539-547.
73. Sontz, C. and Wallace, W. E. (1977), “MIL-STD-781,” Proceedings 1977 Annual Reliability and Maintainability Symposium, Philadelphia, PA, 448-453.
74. Stacy, E. W. (1962), “A Generalization of the Garmna Distribution,” Annals of Marhematical Statistics, 33, 1187-1192.
75. Stewart, L. and Johnson, I. D. (1972), “Determining Optimum Bum-in ond Replacement Times Using Bayesian Decision Theory,” IEEE Transactions on Reliability, R-21, 3, 170-175.
76. Terrel, J. A. and McGlone, M.E. (1984), “Evaluation of Reliability Growth Models for Electronic Engine Control Systems,” AIAA/SAE/ASME 20th Joint Propulsion Conference, June 11-13, Cincinnati, Ohio, 1-7.
77. Thompson, W. E. (1978), “Software Reliability Growth Modeling,” Reliability Qcowtii: Management, Testing and Modeling, Seminar Proceedings — Institute of Environmental Sciences, February 27-28, 32-41.
78. Truelove, A. J. (1978), “Reliability Growth/Bum-in: The Allocation of Testing Resources," Proceedings of the 4th Aerospace Testing Seminar, 111-114.
79. π International Reliability Physics Symposium, 5-7 April, Tuscon, AZ, 286-291.
80. Washburn, L. (1970), “Determination of Optimal Bum-in Time: A Composite Criterion,” IEEE Transactions on Reliability, R-19. 4,134-140.
81. Watson, G. S. and Wells, W. T. (1961), “On the Possibility of Improving the Mean Useful Life of Items by Eliminating those with Short Lives,” Technometrics, 3, 2, 281-298.
82. Weiss, G. H. and Dishon, M. (1971), “Some Economic Problems Related to Bum-in Programs,” IEEE Transactions on Reliability, R-20, 3, 190-195.
83. Whitbeck, C. W. and Leemis, L. M. (1989), “Components vs. System Bum-in Techniques for Electronic Equipment,” IEEE Transactions on Reliability, R-38, 206-209.
84. Zimmerman, W. (1983), “Screening Tests to Monitor Early Life Failure,” Proceedings 1983 Annual Reliability and Maintainability Symposium, 443-447.