Experiences with Concurrent Fault Simulation of Diagnostic Programs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 9, Issue 6, 1990, Pages 621-628

  Demba, Stephen ^a   Ulrich, Ernst ^a   Lentz, Karen Panetta ^a   Giramma, David ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION--APPLICATIONS; DATA STORAGE, SEMICONDUCTOR--STORAGE DEVICES; STATISTICAL METHODS--APPLICATIONS;

FAULT SIMULATION;

INTEGRATED CIRCUIT TESTING;

EID: 0025442670     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.55192     Document Type: Article

References (10)

1. S. Gai, F. Somenzi, and E. Ulrich, “Advanced techniques for concurrent multilevel simulation,” presented at the ICCAD, Santa Clara, CA, 1986.
2. —, “Advances in concurrent multilevel simulation,” IEEE Trans. on Computer-Aided Design, vol. CAD-6, pp. 1006–1012, 1987.
3. M. A. Kearney, “DECSIM: A Multi-level simulation system for digital design,” presented at the ICCD, Port Chester, NY, 1984.
4. D. J. Machlin, “A general purpose traversal mechanism for concurrent logic simulation,” M.A. thesis, Worcester Polytechnic Institute, Worcester, MA, 1987.
5. D. J. Machlin, D. Gross, S. Kadkade, and E. Ulrich, “Switch-Level concurrent fault simulation based on general purpose list traversal mechanism,” in Proc. IEEE Int. Test Conf., Washington, DC, 1988, pp. 574–581.
6. E. Ulrich and D. Hebert, “Speed and accuracy in digital networks based on structural modeling,” presented at the DAC, Las Vegas, 1982.
7. E. Ulrich, “Concurrent simulation at the switch, gate, and register levels,” presented at the IEEE Int. Test Conf., Philadephia, PA, 1985.
8. E. Ulrich, M. Kearney, J. Tellier, and S. Demba, “Design verification for very large networks based on concurrent simulation and clock suppression, presented at the ICCD, Port Chester, NV, 1983.
9. E. Ulrich and I. Suetsugu, “Techniques for logic and fault simulation,” VLSI Syst. Design, 1986.
10. G. McCarthy, “Fault simulation in the development of a VAX CPU microdiagnostic package,” presented at the DEC Internal Test Sym., Oct. 1987.