Modes of Operation and Radiation Sensitivity of Ultrathin SOI Transistors

IEEE Transactions on Electron Devices

Volumn 37, Issue 5, 1990, Pages 1280-1288

  Mayer, Donald C ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING FILMS; SEMICONDUCTING SILICON;

DEPLETED SOI TRANSISTORS; NMOS TRANSISTORS; RADIATION SENSITIVITY; RADIATION-INDUCED CHARGING; SILICON-ON-INSULATOR (SOI) FILMS; ULTRATHIN SOI TRANSISTORS;

TRANSISTORS, FIELD EFFECT;

EID: 0025430219     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.108190     Document Type: Article

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