Advanced X-ray analysis of polycrystalline CuInSe2 thin films

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 1, Issue , 1990, Pages 787-792

  Dittrich, H ^a   Menner, R ^a   Schock, H W ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS - THIN FILMS; SEMICONDUCTING INDIUM COMPOUNDS - THIN FILMS; SEMICONDUCTING SELENIUM COMPOUNDS - THIN FILMS; SOLAR CELLS;

FULL WIDTH AT HALF MAXIMUM (FWHM); PEAK PROFILE FITTING; POLE FIGURE MEASUREMENTS; POLYCRYSTALLINE THIN FILMS; RESIDUAL ERROR FACTORS; X-RAY POWDER DIFFRACTION (XRD) ANALYSIS;

SEMICONDUCTING FILMS;

EID: 0025421420     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)