A Partial Scan Method for Sequential Circuits with Feedback

IEEE Transactions on Computers

Volumn 39, Issue 4, 1990, Pages 544-548

  Cheng, Kwang Ting ^a   Agrawal, Vishwani D ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

Design for testability; scan design; sequential circuit testing; test generation

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; ELECTRONIC CIRCUITS, FLIP FLOP; LOGIC CIRCUITS--AUTOMATIC TESTING; MATHEMATICAL TECHNIQUES--GRAPH THEORY;

AUTOMATIC TEST PATTERN GENERATION; GRAPH ALGORITHMS; PARTIAL SCAN DESIGN;

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0025419945     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.54847     Document Type: Article

References (12)

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