Temperature Dependence of the Channel Hot-Carrier Degradation of n-Channel MOSFET's

IEEE Transactions on Electron Devices

Volumn 37, Issue 4, 1990, Pages 980-993

  Heremans, Paul ^a   Van Den Bosch, Geert ^a   Bellens, Rudi ^a   Groeseneken, Guido ^a   Maes, Herman E ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES--CHARGE CARRIERS; TRANSISTORS, FIELD EFFECT--TESTING;

CARRIER DEGRADATION; TEMPERATURE DEPENDENCE;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0025419847     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.52433     Document Type: Article

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