An analysis of the effects of radio-frequency interference on packaged junction-field-effect transistors

Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an

Volumn 13, Issue 1, 1990, Pages 59-68

  Liu, Cheng Kuang ^a   Cheng, Yu Chan ^b   Jung, Wen Lin ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b Mitac Inc ^*  (Taiwan)

Author keywords

Computer aided analysis; Junction field effect transis tors; Noise; Parasitic components; Radio frequency interference

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER SOFTWARE; RADIO INTERFERENCE;

JUNCTION FIELD EFFECT TRANSISTORS; PARASITIC COMPONENTS; SOFTWARE PACKAGE SPICE2;

TRANSISTORS, FIELD EFFECT;

EID: 0025252051     PISSN: 02533839     EISSN: 21587299     Source Type: Journal    
DOI: 10.1080/02533839.1990.9677231     Document Type: Article

References (10)

1. Forcier, M.L. And R.E. Richardson, “Microwave- Rectification RFI Response in Field-Effect Transistors,” IEEE Trans. Electromagn. Compat., Vol. EMC-21, pp. 312-315 (1979).
2. Larson, C.E. And J.M. Roe, “A Modified Ebers-Moll Transistor Model for RF-Interference Analysis,” IEEE Trans. Electromagn. Compat., Vol. EMC-21, pp. 283-290(1979).
3. Nagel, L.W. And D.O. Pederson, SPICE: Simulation Program with Integrated Circuit Emphases, Elec­tronics Research Laboratory, University of Cali­fornia, Berkeley, CA, Tech. Memo ERL-M382, pp. 1-11 (1973).
4. Richardson, R.E., “Quiescent Operating Point Shift in Bipolar Transistors with AC Excitation,” IEEE J. Solid State Circuits, Vol. SC-14, pp. 1087-­1094 (1979).
5. Stoller, A.I., “Calculation of the Electrical Parame­ters of Transistor Chips from Measurements Made on Packaged Units,” RCA Rev., pp. 600-617 (1968).
6. Whalen, J.J. And C. Paludi, “Computer-Aided Analysis of Electronic Circuits — the Need to Include Parasitic Elements,” lnt. J. Electron., Vol. 43, pp. 501-511 (1977).
7. White, D.R.J., A Handbook on EMI Control Methods and Techniques, Don white Consultants, Gainesville, Virginia, pp. 1.13-2.39 (1973).
8. White, D.R.J., EMI Control Methodology and Procedures, Don White Consultants, Gainesville, Virginia, pp. 1.11-1.14 (1982).
9. White, D.R.J., Electromagnetic Interference Test Methods and Procedures, Don White Consultants, Gainsville, Virginia, pp. 2.1-2.23 (1980).
10. Whalen, J.J., “Predicting RFI Effects in Semi­conductor Devices at Frequencies Above 100 MHz,” IEEE Trans. Electromagn. Compat., Vol. EMC-21, pp. 281-282(1979).