Investigation of self-heating in VLSI and ULSI MOSFETs

Volumn , Issue , 1990, Pages 221-226

  Mautry, P G ^a   Trager, J ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, VLSI; SEMICONDUCTOR DEVICES, MOSFET; TEMPERATURE MEASUREMENT;

CHANNEL CONDUCTIVITY; COLD TRANSISTORS; SELF-HEATING EFFECT; SHORT TRANSISTORS; SHORT-CHANNEL DEVICES;

INTEGRATED CIRCUITS, ULSI;

EID: 0025211979     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icmts.1990.67907     Document Type: Conference Paper

References (5)