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Volumn 44, Issue 3, 1990, Pages 302-312

Evidence for a single shallow hydrogen trap in hydrogen implanted graphite

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN--TRANSPORT PROPERTIES;

EID: 0025209258     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(90)90643-9     Document Type: Article
Times cited : (23)

References (50)
  • 1
    • 84913939590 scopus 로고
    • Proc. 7th Int. Conf. on Plasma-Surface Interactions in Controlled Fusion DEvices
    • See, for example, Princeton, NJ, USA (5–9 May 1986)
    • (1987) J. Nucl. Mater. , vol.145-147
    • Cohen1    Cecchi2    Dylla3
  • 26
  • 27
    • 84913936341 scopus 로고    scopus 로고
    • private communication.
  • 32
    • 84913936895 scopus 로고    scopus 로고
    • Unpublished resistivity measurements of D.T. Eggen, quoted by G.R. Henning and J.H. Hove, Proc., Conf. on Peaceful Uses of Atomic Energy (United Nations) vol. 7, p. 666.
  • 35
    • 84913932507 scopus 로고    scopus 로고
    • B.W. Dodson (private communication);
  • 44
    • 84913906801 scopus 로고    scopus 로고
    • S.M. Myers and P.S. Richards, private communication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.