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Review of Scientific Instruments

Volumn 61, Issue 2, 1990, Pages 874-886

Optical probes for local void fraction measurements: Characterization of performance

(1) Cartellier, Alain a

a Institut de Mecanique de Grenoble (France)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL; PROBES; VOID FRACTION;

EID: 0025130316 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1141457 Document Type: Article

Times cited : (123)

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