Measurement of the cross correlation between baseband and transposed flicker noises in a GaAs MESFET

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1990, Pages 1261-1264

  Dallas, Paul A ^a   Everard, Jeremy K A ^a  

^a KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; PHASE MODULATION; SEMICONDUCTING GALLIUM ARSENIDE;

TRANSPOSED FLICKER NOISES;

SEMICONDUCTOR DEVICES, MESFET;

EID: 0025065875     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)