Characterization of conductor-backed coplanar waveguide using accurate on-wafer measurement techniques

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1990, Pages 1129-1132

  Shih, Yi Chi ^a   Maher, Mark ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES--MEASUREMENTS; MEASUREMENT ERRORS; MICROWAVE DEVICES;

COPLANAR WAVEGUIDES; UNCERTAINTY ANALYSIS;

WAVEGUIDES;

EID: 0024984418     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)