Easily computed functional level testability measure

Volumn , Issue , 1989, Pages 381-390

  Thearling, Kurt ^a   Abraham, Jacob ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; INFORMATION THEORY;

CIRCUIT PARTITIONING; FUNCTIONAL TESTABILITY; TEST POINT INSERTION; TESTABILITY MEASURE;

ELECTRONIC CIRCUITS, DIGITAL;

EID: 0024942215     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)