Functional-level test generation methodology using two-level representations

Proceedings - Design Automation Conference

Volumn , Issue , 1989, Pages 722-725

  Dave, Utpal J ^a   Patel, Janak H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; INTEGRATED CIRCUIT TESTING;

FUNCTIONAL-LEVEL TESTING; PODEM-BASED ALGORITHM; TEST GENERATION; TEST VECTORS;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0024940162     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)