Test set embedding in a built-in self-test environment

Volumn , Issue , 1989, Pages 257-263

  Akers, Sheldon B ^a   Jansz, Winston ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS, COUNTING; ELECTRONIC EQUIPMENT TESTING; LOGIC CIRCUITS, COMBINATORIAL;

BENCHMARK CIRCUITS; BINARY COUNTER; BUILT-IN SELF-TEST (BIST); TEST PATTERN GENERATOR; XOR GATES;

INTEGRATED CIRCUIT TESTING;

EID: 0024934580     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)