Variation in SEU Sensitivity of Dose-Imprinted CMOS SRAMS

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 2330-2338

  Stassinopoulos, E G ^a   Brucker, G J ^b   Van Gunten, O ^c   Kim, H S ^d  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b GE Astro Space Division   (United States)

^c LABORATORY FOR PHYSICAL SCIENCES   (United States)

^d Science System & Applications Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--RANDOM ACCESS; GAMMA RAYS; ION BEAMS;

CMOS TECHNOLOGY; LINEAR ENERGY TRANSFER; SINGLE EVENT UPSETS;

INTEGRATED CIRCUITS;

EID: 0024933371     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45444     Document Type: Article

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