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Volumn , Issue , 1989, Pages 735-744
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Built in self test of the Macrolan chip
a
a
Engl
*
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER NETWORKS--LOCAL NETWORKS;
FIBER OPTICS;
SEMICONDUCTOR DEVICES, MOS;
BIST (BUILT-IN SELF-TEST);
CMOS CHIP;
LOCAL AREA NETWORK;
MACROLAN CHIP;
MEDIUM ACCESS CONTROLLER (MAC) CHIP;
RANDOM PATTERN TESTING;
INTEGRATED CIRCUIT TESTING;
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EID: 0024925775
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (3)
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References (13)
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