Critical path issue in VLSI designs

Volumn , Issue , 1989, Pages 520-523

  Youssef, Habib ^a   Shragowitz, Eugene ^a   Bening, Lionel ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS--TOPOLOGY; MATHEMATICAL TECHNIQUES--GRAPH THEORY;

COVERAGE FREQUENCIES; CRITICAL NETS; CRITICAL PATHS; SINGLE SCORE FUNCTION; TOTAL PATH DELAY;

INTEGRATED CIRCUITS, VLSI;

EID: 0024923636     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)