Non-contacting probe for measurements on high-frequency planar circuits

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 1989, Pages 823-825

  Osofsky, Samuel S ^a   Schwarz, S E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; INTEGRATED CIRCUITS--MEASUREMENTS; MICROWAVE MEASUREMENTS; PROBES;

INTERNAL CIRCUIT OPERATION; MAGNETIC-FIELD PROBE; MICROFABRICATION; PLANAR CIRCUITS; RAPID PRODUCTION TESTING; S-PARAMETERS;

ELECTRIC MEASURING INSTRUMENTS;

EID: 0024922330     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)