Performance and hot-carrier reliability of deep-submicrometer CMOS

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1989, Pages 71-74

  Chan, T Y ^a   Gaw, H ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOSFET; SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;

CMOS DEVICES; DEEP-SUBMICROMETER CMOS; HOT CARRIER RELIABILITY; N-MOSFET; P-MOSFET; SATURATION TRANSCONDUCTANCE;

INTEGRATED CIRCUITS, CMOS;

EID: 0024918845     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)