Hierarchical test pattern generation based on high-level primitives

Volumn , Issue , 1989, Pages 470-479

  Sarfert, Thomas M ^a   Markgraf, Remo ^a   Trischler, Erwin ^a   Schulz, Michael H ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING--ALGORITHMS; SYSTEMS SCIENCE AND CYBERNETICS--HIERARCHICAL SYSTEMS;

AUTOMATIC TEST PATTERN GENERATION; HIGH LEVEL PRIMITIVES; SOCRATES ALGORITHM;

ELECTRONIC EQUIPMENT TESTING;

EID: 0024917437     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)