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Volumn , Issue , 1989, Pages 185-191
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Locating functional errors in logic circuits
a
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
LOGIC DEVICES--GATES;
FUNCTIONAL ERRORS;
FUNCTIONAL-LEVEL DESCRIPTION;
GATE-LEVEL CIRCUIT;
LOGIC ERRORS;
LOGIC CIRCUITS;
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EID: 0024916005
PISSN: 0738100X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/74382.74414 Document Type: Conference Paper |
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Times cited : (16)
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References (13)
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