SEU measurements on HFETs and HFET SRAMs

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 2362-2366

  Remke, R L ^a   Witmer, S B ^a   Jones, S D F ^a   Barber, F E ^a   Flesner, L D ^b   O'Brien, M E ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b Naval Command   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--RANDOM ACCESS; ELECTRON BEAMS; INTEGRATED CIRCUITS; SEMICONDUCTING GALLIUM ARSENIDE;

SINGLE EVENT UPSETS; STATIC RANDOM ACCESS MEMORIES;

TRANSISTORS, FIELD EFFECT;

EID: 0024913732     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45449     Document Type: Article

References (9)

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2. R. L. Remke, S. D. F. Jones, L. D. Flesner, and M. E. O'Brien, “Single Event Upset Study of GaAs FETs Using Alpha Particles and Electron Beam Pulses,” Single Event Effects Symposium, Los Angeles, April 5–6, 1988.
3. L. D. Flesner, Naval Ocean Systems Center Technical Rept. 1170, July 1987.
4. L. D. Flesner, R. Zuleeg, and W. A. Kolasinki, “Comparison of Heavy Ion and Electron-Beam Upset Data for GaAs SRAMS,” IEEE Trans. Nucl. Sci., Vol 35, No. 6, pp.1670-1672, Dec. 1988.
5. P.J. McNulty, W. Abdel-Kader, A.B. Campbell, A.R. Knudsen, P. Shapiro, F. Eisen, and S. Roosild, “Charge Collection in GaAs Test Structures,” IEEE Trans. Nucl. Sci., NS-31, No. 6, pp. 1128–1131, Dec. 1984.
6. L. D. Flesner, N. M. Davis and H. H. Wieder, “High Speed Response of a GaAs Metal-Semiconductor Field-Effect Transistor to Electron-beam Excitation,” J. Appl. Phys., Vol. 53, No. 5, pp. 3873–3877, May 1982.
7. Y. Umemotto, N. Matunaga, and K. Mitsusada, “A Bipolar Mechanism for Alpha-Particle-Induced Soft Errors in GaAs Integrated Circuits,” Vol 36, No. 5, pp. 864–870, May, 1989.
8. F. Barber, “GaAs Radiation Hardened Design Techniques,” IEEE Proceedings, Vol. 76, No. 11, pp. 1501–1508, Nov. 1988.
9. E. L. Petersen, J. B. Langworthy, and S. E. Diehl, “Suggested Single Event Upset Figure of Merit,” Vol. NS-30, No. 6, pp. 4533–4539, Dec. 1983.