The direct measurement of dose enhancement in gamma test facilities

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 1890-1895

  Burke, E A ^a   Snowden, D P ^a   Lowe, L F ^b   Cappelli, J R ^c   Mittleman, S ^c  

^a MISSION RESEARCH CORPORATION   (United States)

^b Rome Air Development Center Hanscom AFB ^*  (United States)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GAMMA RAYS; INTEGRATED CIRCUITS; IONIZATION CHAMBERS; SEMICONDUCTING SILICON;

COMPTON SCATTERING; DOSE-ENHANCEMENT FACTORS;

SEMICONDUCTOR DEVICES;

EID: 0024913724     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45383     Document Type: Article

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