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Volumn , Issue , 1989, Pages 795-801
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Efficient generation of test patterns using Boolean difference
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER METATHEORY--BOOLEAN FUNCTIONS;
ELECTRONIC EQUIPMENT TESTING;
INTEGRATED CIRCUIT TESTING;
BOOLEAN DIFFERENCE;
BOOLEAN SATISFIABILITY ALGORITHM;
TEST PATTERN GENERATION;
LOGIC CIRCUITS, COMBINATORIAL;
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EID: 0024913660
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (46)
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References (11)
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