Transient radiation test techniques for high-speed analog-to-digital converters

IEEE Transactions on Nuclear Science

Volumn 36, Issue 6, 1989, Pages 2356-2361

  Turflinger, Thomas L ^a   Davey, Martin V ^a  

^a NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PROCESSING--DATA ACQUISITION; GAMMA RAYS; ION BEAMS;

HEAVY IONS; TRANSIENT RADIATION TEST TECHNIQUES;

DATA CONVERSION, ANALOG TO DIGITAL;

EID: 0024908917     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.45448     Document Type: Article

References (2)

1. “Dynamic Performance Testing of A to D Converters,” Hewlett-Packard Product Note 5180A-2.
2. M. Mahoney, “DSP-Based Testing of Analog and Mixed Signal Circuits,” IEEE Computer Society Press, 1987, pp 148.