Testable realization of CMOS combinational circuits

Volumn , Issue , 1989, Pages 509-518

  Chakravarty, Sreejit ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER METATHEORY--BOOLEAN FUNCTIONS; INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICES, MOS; TRANSISTORS, FIELD EFFECT;

CMOS ADDER; CMOS COMBINATIONAL CIRCUITS; PRIMITIVE GATES; STUCK-OPEN FAULTS;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0024908856     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)